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C
Eid E, Lacrevaz T., Bermond C., De Rivaz S., Capraro S., Roullard J., Cadix L., Fléchet B., Farcy A., Ancey P. et al..  2010.  Characterization and modeling of RF substrate coupling effects due to vertical interconnects in 3D integrated circuit stacking. Signal Propagation on Interconnects (SPI), 2010 IEEE 14th Workshop on.
Eid E, Lacrevaz T., Bermond C., De Rivaz S., Capraro S., Roullard J., Cadix L., Fléchet B., Farcy A., Ancey P. et al..  2010.  Characterization and Modelling of Substrate Coupling Effects in 3D Integrated Circuit Stacking. {Materials for Advanced Metallization}.
F
Eid E, Lacrevaz T., Bermond C., Capraro S., Roullard J., Fléchet B., Cadix L., Farcy A., Ancey P., Calmon F. et al..  2010.  Frequency and time domain characterization of substrate coupling effects in 3D integration stack. Electronic Manufacturing Technology Symposium (IEMT), 2010 34th IEEE/CPMT International.